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79
Voted
CAD
2004
Springer
14 years 8 months ago
Multiple-view feature modelling for integral product development
To allow a designer to focus on the information that is relevant for a particular product development phase, is an important aspect of integral product development. Unlike current...
Willem F. Bronsvoort, Alex Noort
81
Voted
VTS
2005
IEEE
151views Hardware» more  VTS 2005»
15 years 2 months ago
A CMOS RF RMS Detector for Built-in Testing of Wireless Transceivers
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
Alberto Valdes-Garcia, Radhika Venkatasubramanian,...