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DATE
2003
IEEE
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DATE 2003
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RF-BIST: Loopback Spectral Signature Analysis
15 years 8 months ago
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Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature A...
Doris Lupea, Udo Pursche, Hans-Joachim Jentschel
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