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146
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VLSID
2008
IEEE
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VLSID 2008
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Incorporating PVT Variations in System-Level Power Exploration of On-Chip Communication Architectures
15 years 10 months ago
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www.engr.colostate.edu
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
Sudeep Pasricha, Young-Hwan Park, Fadi J. Kurdahi,...
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