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    DAC
    2007
    ACM
    91views Computer Architecture» more  DAC 2007»
    Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
    16 years 2 months ago
    Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
    Download  www.ece.umn.edu
    Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
    Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
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