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82
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DATE
1997
IEEE
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DATE 1997
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Random benchmark circuits with controlled attributes
15 years 7 months ago
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www.cecs.uci.edu
Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC'94. This is an ...
Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Suna...
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