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122
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DATE
2006
IEEE
75
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Hardware
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DATE 2006
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Space of DRAM fault models and corresponding testing
15 years 8 months ago
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ce.et.tudelft.nl
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...
Zaid Al-Ars, Said Hamdioui, A. J. van de Goor
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