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120
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DATE
2009
IEEE
93
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DATE 2009
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Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
15 years 10 months ago
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eprints.ecs.soton.ac.uk
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
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