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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 29 days ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel