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101
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VLSID
2004
IEEE
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VLSID 2004
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Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking
16 years 3 months ago
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qav.comlab.ox.ac.uk
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
Gethin Norman, David Parker, Marta Z. Kwiatkowska,...
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