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95
Voted
DFT
2007
IEEE
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VLSI
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DFT 2007
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Production Yield and Self-Configuration in the Future Massively Defective Nanochips
15 years 9 months ago
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homepages.laas.fr
We address two problems in this work, namely, 1) the resilience challenge in the future chips made up of massively defective nanoelements and organized in replicative multicore ar...
Piotr Zajac, Jacques Henri Collet
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