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ATS
2003
IEEE
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ATS 2003
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Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
15 years 8 months ago
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ce.et.tudelft.nl
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor
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