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69
Voted
ISCA
2010
IEEE
199views Hardware» more  ISCA 2010»
15 years 27 days ago
Use ECP, not ECC, for hard failures in resistive memories
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...