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141
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VTS
2008
IEEE
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VTS 2008
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Test-Pattern Grading and Pattern Selection for Small-Delay Defects
15 years 9 months ago
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www.engr.uconn.edu
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
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