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130
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DATE
2005
IEEE
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DATE 2005
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Simulation Methodology for Analysis of Substrate Noise Impact on Analog / RF Circuits Including Interconnect Resistance
15 years 5 months ago
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This paper reports a novel simulation methodology for analysis and prediction of substrate noise impact on analog / RF circuits taking into account the role of the parasitic resis...
Charlotte Soens, Geert Van der Plas, Piet Wambacq,...
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