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114
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MTDT
2002
IEEE
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MTDT 2002
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A Fault Modeling Technique to Test Memory BIST Algorithms
15 years 8 months ago
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klabs.org
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...
Raja Venkatesh, Sailesh Kumar, Joji Philip, Sunil ...
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