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118
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DELTA
2008
IEEE
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Information Technology
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DELTA 2008
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AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis
15 years 10 months ago
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hal.archives-ouvertes.fr
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
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