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108
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DATE
2007
IEEE
106
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DATE 2007
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Low-cost protection for SER upsets and silicon defects
15 years 9 months ago
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www.eecs.umich.edu
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kyp...
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