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113
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DAC
2006
ACM
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Computer Architecture
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DAC 2006
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A family of cells to reduce the soft-error-rate in ternary-CAM
16 years 4 months ago
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www.eecg.toronto.edu
Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
Navid Azizi, Farid N. Najm
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