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114
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ICCD
2007
IEEE
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ICCD 2007
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Evaluating voltage islands in CMPs under process variations
16 years 12 days ago
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www.eecs.northwestern.edu
Parameter variations are a major factor causing powerperformance asymmetry in chip multiprocessors. In this paper, we analyze the effects of with-in-die (WID) process variations o...
Abhishek Das, Serkan Ozdemir, Gokhan Memik, Alok N...
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