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ISPASS
2007
IEEE
15 years 3 months ago
An Analysis of Microarchitecture Vulnerability to Soft Errors on Simultaneous Multithreaded Architectures
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
Wangyuan Zhang, Xin Fu, Tao Li, José A. B. ...