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ITC
1997
IEEE
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ITC 1997
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A Novel Functional Test Generation Method for Processors Using Commercial ATPG
15 years 7 months ago
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www.ra.informatik.uni-stuttgart.de
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
Raghuram S. Tupuri, Jacob A. Abraham
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