ICCAD
2005
IEEE
14 years 10 months ago
2005
IEEE
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a “device file setting” ...
ICCAD
2005
IEEE
14 years 10 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
ICCAD
2006
IEEE
14 years 10 months ago
2006
IEEE
Meeting timing constraint is one of the most important issues for modern design automation tools. This situation is exacerbated with the existence of process variation. Current hi...
DAC
2005
ACM
15 years 2 months ago
2005
ACM
DAC
2004
ACM
15 years 2 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...