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FPGA
2007
ACM
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FPGA 2007
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Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
15 years 9 months ago
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Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung
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