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ASPDAC
2007
ACM
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ASPDAC 2007
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A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
15 years 5 months ago
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www.cecs.uci.edu
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
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