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122
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DAC
1997
ACM
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Computer Architecture
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DAC 1997
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Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
15 years 7 months ago
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www.lsi.upc.edu
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
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