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DATE
2009
IEEE
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DATE 2009
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Design as you see FIT: System-level soft error analysis of sequential circuits
15 years 9 months ago
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www.eecs.berkeley.edu
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
Daniel Holcomb, Wenchao Li, Sanjit A. Seshia
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