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65
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DAC
1999
ACM
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Computer Architecture
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DAC 1999
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Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
15 years 10 months ago
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cadlab.ece.ucsb.edu
Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik
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