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    DAC
    1999
    ACM
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    Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
    16 years 2 months ago
    Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
    Download  cadlab.ece.ucsb.edu
    Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik
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