Sciweavers

83
Voted
DATE
2000
IEEE
134views Hardware» more  DATE 2000»
15 years 1 months ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee