136
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TAICPART
2010
IEEE
14 years 11 months ago
2010
IEEE
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
89
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ICCAD
2006
IEEE
15 years 10 months ago
2006
IEEE
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...