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110
Voted
IWANN
1995
Springer
137
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Neural Networks
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IWANN 1995
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Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
15 years 7 months ago
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This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
José Luis Bernier, Juan J. Merelo Guerv&oac...
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