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77
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DATE
2010
IEEE
110
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Hardware
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DATE 2010
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Multi-temperature testing for core-based system-on-chip
15 years 7 months ago
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www.ida.liu.se
—Recent research has shown that different defects can manifest themselves as failures at different temperature spectra. Therefore, we need multi-temperature testing which applies...
Zhiyuan He, Zebo Peng, Petru Eles
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