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ICMENS
2005
IEEE
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ICMENS 2005
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A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches
15 years 8 months ago
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The influence of thermal effects on the reliability of RF MEMS switches is investigated in this paper. Low power consumption and capacity to handle high power at very high frequen...
Jonathan Lueke, Noor Al Quddus, Walied A. Moussa, ...
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