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111
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DAC
2004
ACM
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Computer Architecture
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DAC 2004
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Parametric yield estimation considering leakage variability
15 years 8 months ago
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domino.research.ibm.com
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
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