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120
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ICCAD
2008
IEEE
161
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ICCAD 2008
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A low-overhead fault tolerance scheme for TSV-based 3D network on chip links
15 years 12 months ago
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www-micrel.deis.unibo.it
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
Igor Loi, Subhasish Mitra, Thomas H. Lee, Shinobu ...
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