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ITC
2002
IEEE
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ITC 2002
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Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume
15 years 7 months ago
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ce.et.tudelft.nl
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
M. J. Geuzebroek, J. Th. van der Linden, A. J. van...
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