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97
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ASPDAC
2006
ACM
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ASPDAC 2006
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Generation of shorter sequences for high resolution error diagnosis using sequential SAT
15 years 8 months ago
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www.cecs.uci.edu
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moo...
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