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ITC
1999
IEEE
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ITC 1999
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Defect detection using power supply transient signal analysis
15 years 7 months ago
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www.csee.umbc.edu
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...
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