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118
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DAC
2004
ACM
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Computer Architecture
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DAC 2004
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A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
16 years 3 months ago
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esdat.ucsd.edu
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
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