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134
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GLVLSI
2008
IEEE
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VLSI
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GLVLSI 2008
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NBTI-aware flip-flop characterization and design
15 years 9 months ago
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atrak.usc.edu
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...
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