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VLSID
2007
IEEE
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VLSI
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VLSID 2007
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Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
16 years 3 months ago
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www.eecs.northwestern.edu
Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
Debjit Sinha, Jianfeng Luo, Subramanian Rajagopala...
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