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DFT
2003
IEEE
98views VLSI» more  DFT 2003»
15 years 2 months ago
Constrained ATPG for Broadside Transition Testing
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Xiao Liu, Michael S. Hsiao