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116
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ICCD
2004
IEEE
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ICCD 2004
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A Novel Low-Power Scan Design Technique Using Supply Gating
15 years 12 months ago
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iccd.et.tudelft.nl
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Saibal Mukh...
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