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104
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ICCAD
2010
IEEE
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ICCAD 2010
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Characterizing the lifetime reliability of manycore processors with core-level redundancy
15 years 22 days ago
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www.cse.cuhk.edu.hk
With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...
Lin Huang, Qiang Xu
claim paper
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