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104
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DATE
2007
IEEE
86
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Hardware
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DATE 2007
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Reduction of detected acceptable faults for yield improvement via error-tolerance
15 years 9 months ago
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Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
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