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16

ATS
2000
IEEE

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An adjacency-based test pattern generator for low power BIST design

13 years 9 months ago

An adjacency-based test pattern generator for low power BIST design

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Patrick Girard, Loïs Guiller, Christian Landr

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Added	30 Jul 2010
Updated	30 Jul 2010
Type	Conference
Year	2000
Where	ATS
Authors	Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch

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