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10

ITC
1999
IEEE

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Delay testing of SOI circuits: Challenges with the history effect

13 years 9 months ago

Delay testing of SOI circuits: Challenges with the history effect

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Eric MacDonald, Nur A. Touba

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1999
Where	ITC
Authors	Eric MacDonald, Nur A. Touba

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