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ICCAD 1990
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An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis
13 years 8 months ago
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Yusuf Leblebici, Sung-Mo Kang
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Added
11 Aug 2010
Updated
11 Aug 2010
Type
Conference
Year
1990
Where
ICCAD
Authors
Yusuf Leblebici, Sung-Mo Kang
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