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ASPDAC
2008
ACM

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A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

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A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

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Fei Wang, Yu Hu, Huawei Li, Xiaowei Li

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Added	12 Oct 2010
Updated	12 Oct 2010
Type	Conference
Year	2008
Where	ASPDAC
Authors	Fei Wang, Yu Hu, Huawei Li, Xiaowei Li

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