18 search results - page 1 / 4 » Built-in Self-Test for Memory Resources in Virtex-4 Field Pr... |
CATA
2009
13 years 5 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
CSREAESA
2009
13 years 5 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
DFT
2009
IEEE
13 years 11 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...