5 search results - page 1 / 1 » A Demonstration IC for the P1149.4 Mixed-Signal Test Standar... |
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
Abstract— Numerous machine-learning-based test methodologies have been proposed in recent years as a fast alternative to the standard functional testing of mixed-signal/RF integr...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...
TE
2010
13 years 2 days ago
2010
This paper describes how an intelligent chip architecture has allowed a large cohort of undergraduate students to be given effective practical insight into IC design, by designing ...
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...